POSSIBILITIES OFAPPLICATION OF METHODS OF X-RAY PHASE
AND X-RAY DIFFRACTION ANALYSIS IN THE FORENSIC SCIENCE
Konstantin O. Smirnov
Senior Lecturer, Department of Forensic Examination and Physical Materials Science,
Volgograd State University
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Prosp. Universitetsky, 100, 400062 Volgograd, Russian Federation
Vladimir V. Akatyev
Senior Lecturer, Department of Forensic Examination and Physical Materials Science,
Volgograd State University
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Prosp. Universitetsky, 100, 400062 Volgograd, Russian Federation
Yulia A. Amelchenko
Engineer, Laboratory of X-Ray Structural Analysis,
Department of Forensic Examination and Physical Materials Science,
Volgograd State University
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Prosp. Universitetsky, 100, 400062 Volgograd, Russian Federation
Abstract. The paper reflects various aspects of the use of X-ray investigation methods, their advantages and application in forensic science of the phase composition of metals, paint and varnish coatings and paintwork materials, fragments of explosive devices. Practical examples of X-ray diffraction analysis application for thin film specimens made on the basis of paints containing alkyd varnish, pigments, fillers and solvents of various colour range have been examined. Influence of true physical broadening, on lines of diffractograms taken for samples exposed to shock wave action was also studied. It was found that this broadening is directly connected with influence of microstrains and fine dispersion of mosaic structure blocks. Based on the obtained X-ray diffraction analysis data, the dislocation density was calculated by three methods. Based on summarized experimental and literature data, the dependence of microstrains on the explosive weight was plotted, which can be used as a reference standard for comparison in expert studies of samples exposed to shock-wave impact.
Key words: X-ray structural analysis, X-ray phase analysis, diffractogram, fine structure, mosaic blocks, microstrains, dislocation density.
This work is licensed under a Creative Commons Attribution 4.0 International License.
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