ANALYSIS OF ELECTROMAGNETIC COMPATIBILITY
OF MICROPROCESSOR RELAY PROTECTION
AND AUTOMATION DEVICES

Elena G. Zenina
Candidate of Technical Sciences, Associate Professor
Head of the Department of Power Engineering,
MPEI Branch in Volzhsky
This email address is being protected from spambots. You need JavaScript enabled to view it.
Prosp. Lenina, 69, 404110 Volzhsky, Russian Federation

Abstract. In the modern conditions of the development of the electric power complex, relay protection and automation devices play a special role related to protection against possible damage resulting from violations of normal operating modes, both of individual elements and the entire power system as a whole. This, in turn, directly affects the reliable and stable functioning of the main power elements and electrical equipment. Damage to the power part of the equipment of an electric grid complex can be caused by changes in the main parameters of the normal mode: a change (increase) in currents leads to overloads and, in the limit, to short circuits, a decrease in voltage leads to an avalanche of voltage and disruption of the operation of electric motors connected to the damaged section, and an increase in voltage leads to overvoltages in certain sections. In addition, violations associated with a decrease in the transmitted active power lead to a change in frequency, and a violation of the reactive power balance leads to a change in voltage in certain sections, which generally leads to noncompliance with the power balance and loss of stable operation of the power system. The main reasons for failures in operation, false and excessive triggering of microprocessor relay protection devices are considered. The main ways of solving the problem of electromagnetic compatibility in the electric power industry are identified. A solution is proposed to improve the reliability of the operation of microprocessor relay protection devices and the way of development of the problem of electromagnetic compatibility in the electric power industry is shown.
Key words: electromagnetic compatibility, microprocessor devices, relay protection, failures and damages, reactive power.

 

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